Written by Bre McGahey on . Posted in Add to Home Page Slider, Industry Events

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When: May 1, 2017 - May 3, 2017 - All Day
Where: Walter E. Washington Convention Center, Washington, DC

Connect:ID is an innovative international conference and exhibition that focuses on all aspects of identity technologies and the opportunities for their management in both the physical and digital worlds.

On May 2 at 2:40 PM see Paul Grassi, Senior Standards and Technology Advisor, National Institute of Standards and Technology (NIST) as he presents the session: Going mobile with FIDO authentication.